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1/10/2012 - UBM Electronics Announces the Finalists for the Test & Measurement World Best in Test Awards
 
Upcoming Events Location Date
IPC APEX Expo
Presentations: Teradyne's Alan Albee and Anthony Suto will both present  papers on how ICT technologies are evolving beyond traditional test methods to help manufacturers solve the challenges of limited access PCB Assemblies and expensive functional test stages.
San Diego, California February 28-March 1, 2012
Goepel UK "TechDays"
Presentation: Teradyne's John Walley
Imperial War Museum in Duxford, Cambridge, UK March 8, 2012
NEPCON Shanghai Shanghai, China April 25-27, 2012
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